1PS301
All information provided in this document is subject to legal disclaimers.
? NXP B.V. 2012. All rights reserved.
Product data sheet
Rev. 5 — 6 March 2012
5 of 11
NXP Semiconductors
1PS301
Dual high-speed switching diode
8. Test information
8.1 Quality information
This product has been qualified in accordance
with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
(1) IR
=1mA
Input signal: reverse pulse rise time tr
= 0.6 ns; reverse voltage pulse duration tp
= 100 ns; duty cycle ?
=0.05
Oscilloscope: rise time tr
=0.35ns
Fig 5. Reverse recovery time test circuit and waveforms
Input signal: forward pulse rise time tr
= 20 ns; forward current pulse duration tp
?
100 ns; duty cycle ??0.005
Fig 6. Forward recovery voltage test circuit and waveforms
trr
(1)
+
I
F
t
output signal
tr
tp
t
10 %
90 %
VR
input signal
V = VR +
IF ×
RS
RS = 50 Ω
IF
D.U.T.
Ri
= 50
Ω
SAMPLING
OSCILLOSCOPE
mga881
tr
t
tp
10 %
90 %
I
input signal
RS
= 50
Ω
I
Ri
= 50
Ω
OSCILLOSCOPE
1 kΩ
450 Ω
D.U.T.
mga882
VFR
t
output signal
V
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